説明
SEM - Critical Dimension (CD) Measurement構成
構成なしOEMモデルの説明
CG5000 is designed to meet the needs for higher accuracy and versatility in development and manufacturing processes of new generation semiconductor devices. Hitachi High-Tech achieved new records*2 for throughput and metrology accuracy repeatability with the CG5000 by redesigning the transfer system and employing improved electron optics and image processing technologies.ドキュメント
ドキュメントなし
HITACHI
CG5000
検証済み
カテゴリ
CD-SEM
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
84403
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
CG5000
検証済み
カテゴリ
CD-SEM
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
84403
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
SEM - Critical Dimension (CD) Measurement構成
構成なしOEMモデルの説明
CG5000 is designed to meet the needs for higher accuracy and versatility in development and manufacturing processes of new generation semiconductor devices. Hitachi High-Tech achieved new records*2 for throughput and metrology accuracy repeatability with the CG5000 by redesigning the transfer system and employing improved electron optics and image processing technologies.ドキュメント
ドキュメントなし