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HITACHI S-9260
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Hitachi Model S-9260 CD-SEM system has been developed to meet the requirements of these new fabrication processes. Having the following features, it can provide a CD measurement environment suitable for fabricating next-generation semiconductor devices: (1) Excellent observation performance based on the electron optical design common in the S-9000 Series, (2) Enhanced CD measurement reproducibility, throughput, and other basic performance capabilities, (3) Improved process-variation monitoring, (4) Instrument performance maintenance/control support functions, and (5) New process application functions such as those for beam-tilt observations, surface charged-specimen measurements, and ArF-resist measurements.
    ドキュメント

    ドキュメントなし

    HITACHI

    S-9260

    verified-listing-icon

    検証済み

    カテゴリ
    CD-SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    109926


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    HITACHI S-9260

    HITACHI

    S-9260

    CD-SEM
    ヴィンテージ: 0状態: 改修済み
    最終確認60日以上前

    HITACHI

    S-9260

    verified-listing-icon
    検証済み
    カテゴリ
    CD-SEM
    最終検証: 60日以上前
    listing-photo-d16bfb43ba434e8b9de72402a6327a86-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    109926


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Hitachi Model S-9260 CD-SEM system has been developed to meet the requirements of these new fabrication processes. Having the following features, it can provide a CD measurement environment suitable for fabricating next-generation semiconductor devices: (1) Excellent observation performance based on the electron optical design common in the S-9000 Series, (2) Enhanced CD measurement reproducibility, throughput, and other basic performance capabilities, (3) Improved process-variation monitoring, (4) Instrument performance maintenance/control support functions, and (5) New process application functions such as those for beam-tilt observations, surface charged-specimen measurements, and ArF-resist measurements.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    HITACHI S-9260

    HITACHI

    S-9260

    CD-SEMヴィンテージ: 0状態: 改修済み最終検証:60日以上前
    HITACHI S-9260

    HITACHI

    S-9260

    CD-SEMヴィンテージ: 0状態: 中古最終検証:60日以上前
    HITACHI S-9260

    HITACHI

    S-9260

    CD-SEMヴィンテージ: 0状態: 中古最終検証:60日以上前