COMPASS 200
概要(Overview)
Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
現在の掲載品
4
サービス
検査、保証、鑑定、ロジスティクス
トップ掲載リスト
APPLIED MATERIALS (AMAT)
COMPASS 200
Defect Inspectionヴィンテージ: 2000状態: 中古最終確認60日以上前APPLIED MATERIALS (AMAT)
COMPASS 200
Defect Inspectionヴィンテージ: 状態: 中古最終確認60日以上前APPLIED MATERIALS (AMAT)
COMPASS 200
Defect Inspectionヴィンテージ: 状態: 部品ツール最終確認60日以上前APPLIED MATERIALS (AMAT)
COMPASS 200
Defect Inspectionヴィンテージ: 2001状態: 中古最終確認60日以上前