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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) COMPASS 200
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
    ドキュメント

    ドキュメントなし

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    44402


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) COMPASS 200

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    Defect Inspection
    ヴィンテージ: 2000状態: 中古
    最終確認60日以上前

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-7f95195d8fda4220b1ef7b8253c1ae8a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    44402


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) COMPASS 200

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    Defect Inspectionヴィンテージ: 2000状態: 中古最終検証:60日以上前
    APPLIED MATERIALS (AMAT) COMPASS 200

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前
    APPLIED MATERIALS (AMAT) COMPASS 200

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    Defect Inspectionヴィンテージ: 0状態: 部品ツール最終検証:60日以上前