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APPLIED MATERIALS (AMAT) COMPLUS MP
    説明
    Darkfield Inspection
    構成
    構成なし
    OEMモデルの説明
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    ドキュメント

    ドキュメントなし

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 7日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    83119


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認7日前

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 7日前
    listing-photo-28487635bf294f0084c7b6d5e14dc092-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    83119


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Darkfield Inspection
    構成
    構成なし
    OEMモデルの説明
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:7日前
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:7日前
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前