説明
Metrology / inspection system構成
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEMモデルの説明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
154786
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
APPLIED MATERIALS (AMAT)
SEMVISION G2
カテゴリ
Defect Inspection
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
154786
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Metrology / inspection system構成
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEMモデルの説明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.ドキュメント
ドキュメントなし