説明
-Main System Active damping subsystem (1) -Handler System E-chuck wafer holder & controller (1) -Factory Interface FOUP (2) -Handler System Pre Aligner (1)構成
E84, SECS/GEM, GEM300: CIM Software Version: 5.4.500OEMモデルの説明
The SEMVISION G5 is part of the Applied SEMVision™ family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 2,400 defects per hour. Used in an optimized defect review strategy, these systems can accelerate customers’ production ramp by rapidly identifying the root cause of systematic and yield-limiting defects.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
150394
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
SEMVISION G5 HP
カテゴリ
Defect Inspection
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
150394
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
-Main System Active damping subsystem (1) -Handler System E-chuck wafer holder & controller (1) -Factory Interface FOUP (2) -Handler System Pre Aligner (1)構成
E84, SECS/GEM, GEM300: CIM Software Version: 5.4.500OEMモデルの説明
The SEMVISION G5 is part of the Applied SEMVision™ family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 2,400 defects per hour. Used in an optimized defect review strategy, these systems can accelerate customers’ production ramp by rapidly identifying the root cause of systematic and yield-limiting defects.ドキュメント
ドキュメントなし