Applied Materials is committed to accelerating this new PPACt playbook for our customers and partners. We have the broadest and deepest portfolio of products for delivering PPACt innovations to the market. This portfolio encompasses the ability to create and deposit, shape and remove, modify, analyze, and connect materials and devices in new ways. We are unique in having a broad suite of process technology and metrology capabilities under one roof, and we have highly differentiated silicon and packaging lab capabilities. Our Integrated Materials Solutions co-optimize materials deposition, removal, modification, and analysis to create new materials and engineer new structures for high-performance, low-power chips at leading-edge nodes.

APPLIED MATERIALS (AMAT)

Semvision G5, enables chipmakers to image and analyze 20nm yield-limiting defects in a production environment without manual intervention. Uniquely capable of identifying and imaging relevant defects with 1nm pixel size, the SEMVision G5 system allows logic and memory customers to streamline manufacturing, pinpointing the root cause of defects faster and more accurately than ever before."
The breakthrough SEMVision G5 system is an open architecture platform that dynamically combines data received from a wafer inspection system with a library of predefined review strategies. The system automatically creates new review recipes - a major benefit over competing tools that require time-consuming manual recipe creation for every chip type to be inspected. This feature is critical for foundry customers that must rapidly achieve good yield in the thousands of new chip designs they manufacture each year.

SEMVISION G5

37A726E1-0FC5-433D-9D88-12E0FCA662DD_1_201_a.jpeg

B44E16A1-282D-40CF-9576-C5FA4690AB8E.jpeg

1A91578B-21EB-4444-ABF6-882E0FF56F26.jpeg

3E29D897-EDF3-45A4-90E7-650CB0AACEE9.jpeg

D6DD03EA-0274-4EF2-B201-8F7EFC9B91A7.jpeg

BDE9B0F6-01CA-4FB4-8AF1-0D0287905CFB.jpeg

4901FE78-678C-4F18-8DE6-50CE6B2F5F4C.jpeg

6100C98F-D92E-47CD-9C8B-3985B3054F3D.jpeg

0CBDC605-0165-479A-BB6B-28724E6F68AD.jpeg

D9E070F4-3EB1-4346-A60B-7AC8AB9DCFF5.jpeg

APPLIED MATERIALS (AMAT)

SEMVISION G5

Defect Inspection

同様のリスト

APPLIED MATERIALS (AMAT)

SEMVISION G5

APPLIED MATERIALS (AMAT)

SEMVISION G5

SEMVISION G5

Defect Inspection

同様のリスト

APPLIED MATERIALS (AMAT)

SEMVISION G5

APPLIED MATERIALS (AMAT)

SEMVISION G5