メインコンテンツにスキップ
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 続きを読む

Moov logo

Moov Icon

WF-736 XS

カテゴリ
Defect Inspection
概要(Overview)

The WF-736 XS system is an enhanced version of the WF-736 system introduced by Applied Materials in fiscal 1999. This system offers greater sensitivity for devices with a size of 0.15 microns and below, making it suitable for the production of advanced microchips.

現在の掲載品

1

サービス

検査、保証、鑑定、ロジスティクス

トップ掲載リスト

このような製品をお持ちですか?
Moovに掲載品して、すぐに申し分ない購入者を見つけましょう。