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説明
Pattern Inspection構成
構成なしOEMモデルの説明
The WF-736 XS system is an enhanced version of the WF-736 system introduced by Applied Materials in fiscal 1999. This system offers greater sensitivity for devices with a size of 0.15 microns and below, making it suitable for the production of advanced microchips.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
109289
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
WF-736 XS
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
109289
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Pattern Inspection構成
構成なしOEMモデルの説明
The WF-736 XS system is an enhanced version of the WF-736 system introduced by Applied Materials in fiscal 1999. This system offers greater sensitivity for devices with a size of 0.15 microns and below, making it suitable for the production of advanced microchips.ドキュメント
ドキュメントなし