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APPLIED MATERIALS (AMAT) COMPLUS 3T
    説明
    Dark field detection No missing parts Current Wafer size : 12
    構成
    構成なし
    OEMモデルの説明
    The AMAT / APPLIED MATERIALS ComPLUS 3T wafer inspection system detects defects in devices with design rules of 65nm and below. The AMAT / APPLIED MATERIALS ComPLUS 3T is used for darkfield applications. The The AMAT / APPLIED MATERIALS ComPLUS 3T wafer and mask inspection system can be used for 12" wafers. Applied ComPlus 3T Inspection is a patterned wafer inspection system that performs high-speed inspection of all Darkfield and BEOL Brightfield applications for 65nm production. Using dual-angle illumination and proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield. Based on the highly successful Compass platform, the ComPlus 3T system transcends the boundaries of traditional darkfield and brightfield inspection, covering the widest optical inspection spectrum with one platform. The ComPlus 3T system solution delivers exceptional advantages in system sensitivity and throughput, as well as significant savings to customers who typically purchase multiple highly specialized inspection tools to cover the same range of applications.
    ドキュメント

    ドキュメントなし

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    Deinstalled


    製品ID:

    107072


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-ecadf588a59d462a92a1ca14d4d23405-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    Deinstalled


    製品ID:

    107072


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Dark field detection No missing parts Current Wafer size : 12
    構成
    構成なし
    OEMモデルの説明
    The AMAT / APPLIED MATERIALS ComPLUS 3T wafer inspection system detects defects in devices with design rules of 65nm and below. The AMAT / APPLIED MATERIALS ComPLUS 3T is used for darkfield applications. The The AMAT / APPLIED MATERIALS ComPLUS 3T wafer and mask inspection system can be used for 12" wafers. Applied ComPlus 3T Inspection is a patterned wafer inspection system that performs high-speed inspection of all Darkfield and BEOL Brightfield applications for 65nm production. Using dual-angle illumination and proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield. Based on the highly successful Compass platform, the ComPlus 3T system transcends the boundaries of traditional darkfield and brightfield inspection, covering the widest optical inspection spectrum with one platform. The ComPlus 3T system solution delivers exceptional advantages in system sensitivity and throughput, as well as significant savings to customers who typically purchase multiple highly specialized inspection tools to cover the same range of applications.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspectionヴィンテージ: 2005状態: 改修済み最終検証:60日以上前
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspectionヴィンテージ: 2006状態: 中古最終検証:60日以上前