説明
Temporary storage area構成
QC_CuOEMモデルの説明
NanoUDI 9300 standalone wafer particle and defect inspection system. The NanoUDI 9300 stand-alone, high throughput, full-wafer defect inspection system detects and measures particles and defects as small as 0.1 microns on 300 millimeter diameter semiconductor wafers. The system was first introduced at SEMICON West in July 2002 and is built on the common 9300 wafer automation platform that includes the new industry standards for 300 millimeter wafer handling.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
144864
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NanoUDI 9300
カテゴリ
Defect Inspection
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
144864
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Temporary storage area構成
QC_CuOEMモデルの説明
NanoUDI 9300 standalone wafer particle and defect inspection system. The NanoUDI 9300 stand-alone, high throughput, full-wafer defect inspection system detects and measures particles and defects as small as 0.1 microns on 300 millimeter diameter semiconductor wafers. The system was first introduced at SEMICON West in July 2002 and is built on the common 9300 wafer automation platform that includes the new industry standards for 300 millimeter wafer handling.ドキュメント
ドキュメントなし