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CI-G10

カテゴリ
Defect Inspection
概要(Overview)

Component Inspector, tube-based. The CI-G10 is a fully automatic system for the final inspection of semiconductor components of devices handled in tubes. Typical components include SO devices and QFN or other LFCSP’s. The CI-G10 performs the optical inspection and, if required, the taping of these components.

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