WI-3000
概要(Overview)
The WI-3000 series inspects both two- and three-dimensional aspects and is designed for high speed inspection of all the bumps on a wafer.
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The WI-3000 series inspects both two- and three-dimensional aspects and is designed for high speed inspection of all the bumps on a wafer.
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検査、保証、鑑定、ロジスティクス