説明
説明なし構成
構成なしOEMモデルの説明
The Candela OSA 6100 and 6120 series systems introduce X-Beam channel technology, adding radial illumination to the existing circumferential illumination design, plus advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system simultaneously detects and classifies defects such as particles, pits and stains; characterizes lubricant thickness, and uses the Kerr Effect to characterize magnetic imaging.ドキュメント
ドキュメントなし
KLA
CANDELA 6120
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
90107
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA 6120
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
90107
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The Candela OSA 6100 and 6120 series systems introduce X-Beam channel technology, adding radial illumination to the existing circumferential illumination design, plus advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system simultaneously detects and classifies defects such as particles, pits and stains; characterizes lubricant thickness, and uses the Kerr Effect to characterize magnetic imaging.ドキュメント
ドキュメントなし