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KLA SPECTRAFX 100
    説明
    説明なし
    構成
    Tool is already deinstalled and in warehouse. Tool was fully functional prior to deinstallation. Inspect to confirm configuration and condition of tool. Tool Model : SpectraShape 8660 Software version: 6.20.30.10105 System power rating: 208 AC 2 Phase Loading Configuration: 3 loaders (auto) Operating System: Microsoft Windows XP 1. Handler Unit 2. Metrology Unit No missing or damaged parts reported. <u>Note:</u> Unable to verify if tool&#39;s nameplate is present, and may pose an issue for shipment to China (CCIC) Need inspect to confirm.
    OEMモデルの説明
    SpectraFx 100 is KLA-Tencor’s next-gen thin film metrology solution that meets the process control requirements for 90nm devices, including 193nm DUV lithography processes. It supports next-gen and “operator-free” 300mm fabs with advanced automation and tool-to-tool matching capabilities, reducing process development time for advanced materials and accelerating their adoption into volume production. It also enables extensive product wafer monitoring and characterization required to accurately measure advanced thin films. It fully supports SEMI requirements for communication to automation tracks and materials process flow, delivering the precision, stability, and matching required for advanced thin film-measurement applications for 90nm device production. It achieves exceptional tool-to-tool matching and enables the use of a small spot size on product wafers, eliminating the use of monitor wafers.
    ドキュメント

    ドキュメントなし

    KLA

    SPECTRAFX 100

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    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 60日以上前
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    13871


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2017

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA SPECTRAFX 100
    KLASPECTRAFX 100Defect Inspection
    ヴィンテージ: 2003状態: 中古
    最終確認60日以上前

    KLA

    SPECTRAFX 100

    verified-listing-icon

    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 60日以上前
    listing-photo-8DrvTXRmkWm9zjuoC3A_Nz2GF3lOOqRKgLVAYeAJEcE-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    13871


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2017


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    Tool is already deinstalled and in warehouse. Tool was fully functional prior to deinstallation. Inspect to confirm configuration and condition of tool. Tool Model : SpectraShape 8660 Software version: 6.20.30.10105 System power rating: 208 AC 2 Phase Loading Configuration: 3 loaders (auto) Operating System: Microsoft Windows XP 1. Handler Unit 2. Metrology Unit No missing or damaged parts reported. <u>Note:</u> Unable to verify if tool&#39;s nameplate is present, and may pose an issue for shipment to China (CCIC) Need inspect to confirm.
    OEMモデルの説明
    SpectraFx 100 is KLA-Tencor’s next-gen thin film metrology solution that meets the process control requirements for 90nm devices, including 193nm DUV lithography processes. It supports next-gen and “operator-free” 300mm fabs with advanced automation and tool-to-tool matching capabilities, reducing process development time for advanced materials and accelerating their adoption into volume production. It also enables extensive product wafer monitoring and characterization required to accurately measure advanced thin films. It fully supports SEMI requirements for communication to automation tracks and materials process flow, delivering the precision, stability, and matching required for advanced thin film-measurement applications for 90nm device production. It achieves exceptional tool-to-tool matching and enables the use of a small spot size on product wafers, eliminating the use of monitor wafers.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA SPECTRAFX 100
    KLA
    SPECTRAFX 100
    Defect Inspectionヴィンテージ: 2003状態: 中古最終検証: 60日以上前