Broadband Plasma Patterned Wafer Inspection

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

In 1992, KLA introduced a new generation of reticle inspection systems, the 300 series.

KLA

300

Defect Inspection

同様のリスト

300

Defect Inspection

同様のリスト