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KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
  • KLA SURFSCAN 4500
説明
Fully Refurbished & Calibrated Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included
構成
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 0.2 µ Particle Size Sensitivity
OEMモデルの説明
提供なし
ドキュメント

ドキュメントなし

PREFERRED
 
SELLER
verified-listing-icon

検証済み

カテゴリ
Defect Inspection

最終検証: 60日以上前

Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Refurbished


稼働ステータス:

不明


製品ID:

110911


ウェーハサイズ:

不明


ヴィンテージ:

1987


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA

SURFSCAN 4500

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
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listing-photo-1fe011bd3c24487b8408716014c50c09-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/1fe011bd3c24487b8408716014c50c09/37909eeec4cc4c4c8d0e51d1f892e549_f4902f74684349de94dd6e5082baa98b_mw.png
listing-photo-1fe011bd3c24487b8408716014c50c09-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/1fe011bd3c24487b8408716014c50c09/2b82e5405e1440fda8c423419faa1030_76b62f497d7f42b3b265d77556d10bf81201a_mw.jpeg
Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Refurbished


稼働ステータス:

不明


製品ID:

110911


ウェーハサイズ:

不明


ヴィンテージ:

1987


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Fully Refurbished & Calibrated Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included
構成
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 0.2 µ Particle Size Sensitivity
OEMモデルの説明
提供なし
ドキュメント

ドキュメントなし