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市場 > Defect Inspection > KLA > VIPER 2435XP

VIPER 2435XP

カテゴリ
Defect Inspection
概要(Overview)

In May 2006, KLA introduced the Viper 2435XP™ automated 300mm wafer and tool dispositioning system, which captures a broad range of defect types at very high throughput—enabling inspection of 100% of wafer lots. Delivering quick go/no-go decisions, the system enables fab engineers to take corrective action early, when wafers can be reworked or process tool problems can be repaired before additional lots are put at risk. Viper 2435XP can be integrated rapidly and seamlessly into a production environment in the lithography, CMP, etch, and films process modules.

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