For R&D and production ramp, the C205 patterned wafer inspector utilizes broadband illumination and NanoPoint technology for high sensitivity discovery of critical defects, helping speed optimization of new processes and devices.

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

C205

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