The eDR7280 is an electronbeam wafer defect review and classification system that utilizes improved imaging and automatic defect classification capability to identify detected defects and produce an accurate representation of the detected defect population.

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

eDR-7280

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