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3Di-8500

カテゴリ
Defect Inspection
概要(Overview)

Automated wafer bump inspection and metrology systems. In 2002, August enhanced NSX product family with the introduction of the affordable 3Di-7500 and a high performance 3Di-8500. The 3Di Series has quickly developed a reputation as an essential tool for those manufacturers with high volume advanced packaging manufacturing processes. With three model options, the 3Di Series is well suited to serve the needs of our customers.

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