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NIKON OPTISTATION-3100
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The OPTISTATION -3000 series is newly equipped with Nikon’s acclaimed CFI60 optics, producing clear images with high contrast and minimal flare. DUV microscope module can be mounted as an option to meet the most advanced design rules that are increasingly becoming finer. • Equipped with Nikon’s proprietary CFI60 optics to produce clear images with high contrast and minimal flare. The Dark field signal-to-background ratio is three times higher than with conventional Nikon optics, ensuring significantly better imaging. • Nikon’s acclaimed wide illuminator (WIL) and line illuminator (LIL) enable macro inspections under ideal conditions. • Can be equipped with the newly designed DUV microscope module (as an option), supports the latest design rules. • State-of-the-art image processing and analysis technology enables highly accurate review inspections by using ADC. This ADC can also be used as a dedicated review station. • Flexibility in load port positioning allows the OPTISTATION-3000 series to meet a variety of layouts and requirements of factory automation handling φ300mm wafers. OHT and other automatic transfer systems are supported too. • Optimal recipe conditions are simply created by an easily accessible touch-screen. According to specifications of objective lens and wafer that is inspected, optimal observation settings, including aperture and light intensity can be set in advance. Specifications Supports φ 300mm (12") wafers 3100 (1 FOUP)
    ドキュメント

    ドキュメントなし

    NIKON

    OPTISTATION-3100

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    108083


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    NIKON OPTISTATION-3100

    NIKON

    OPTISTATION-3100

    Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    NIKON

    OPTISTATION-3100

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-08961f64af7b490fb9fea7da69f9a5ab-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    108083


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The OPTISTATION -3000 series is newly equipped with Nikon’s acclaimed CFI60 optics, producing clear images with high contrast and minimal flare. DUV microscope module can be mounted as an option to meet the most advanced design rules that are increasingly becoming finer. • Equipped with Nikon’s proprietary CFI60 optics to produce clear images with high contrast and minimal flare. The Dark field signal-to-background ratio is three times higher than with conventional Nikon optics, ensuring significantly better imaging. • Nikon’s acclaimed wide illuminator (WIL) and line illuminator (LIL) enable macro inspections under ideal conditions. • Can be equipped with the newly designed DUV microscope module (as an option), supports the latest design rules. • State-of-the-art image processing and analysis technology enables highly accurate review inspections by using ADC. This ADC can also be used as a dedicated review station. • Flexibility in load port positioning allows the OPTISTATION-3000 series to meet a variety of layouts and requirements of factory automation handling φ300mm wafers. OHT and other automatic transfer systems are supported too. • Optimal recipe conditions are simply created by an easily accessible touch-screen. According to specifications of objective lens and wafer that is inspected, optimal observation settings, including aperture and light intensity can be set in advance. Specifications Supports φ 300mm (12") wafers 3100 (1 FOUP)
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    NIKON OPTISTATION-3100

    NIKON

    OPTISTATION-3100

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前