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説明
Automation Microscope HDD is included構成
Microscope (micro) inspection Total magnification 5x to 150x Inspection modes Brightfield, Darkfield, Macro inspection Surface Macro, center backside Macro, perimeter backside Macro Load port 2 FOUP Position selectable from side or rear Wafer transfer Robotic handling; vacuum chuck; noncontact pre-alignment mechanism Operation mouse, keyboardOEMモデルの説明
OPTISTATION-3200 wafer inspection systemドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
118716
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
OPTISTATION-3200
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
118716
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Automation Microscope HDD is included構成
Microscope (micro) inspection Total magnification 5x to 150x Inspection modes Brightfield, Darkfield, Macro inspection Surface Macro, center backside Macro, perimeter backside Macro Load port 2 FOUP Position selectable from side or rear Wafer transfer Robotic handling; vacuum chuck; noncontact pre-alignment mechanism Operation mouse, keyboardOEMモデルの説明
OPTISTATION-3200 wafer inspection systemドキュメント
ドキュメントなし