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説明
Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller-all in one instrument. Contact check function ensures high integrity measurements 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times. Family of products offers wide dynamic range: 1pA to 10A and 1µV to 200V. The embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications. TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 Source Meter channels into a system that can be programmed and controlled as a single instrument. Dual Channel System that can source up to 200V.構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし
KEITHLEY
2612
カテゴリ
Electronic Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
84339
ウェーハサイズ：
不明
ヴィンテージ：
不明
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説明
Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller-all in one instrument. Contact check function ensures high integrity measurements 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times. Family of products offers wide dynamic range: 1pA to 10A and 1µV to 200V. The embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications. TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 Source Meter channels into a system that can be programmed and controlled as a single instrument. Dual Channel System that can source up to 200V.構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし