説明
説明なし構成
構成なしOEMモデルの説明
The 81637B Fast Power Meter is a high-performance instrument designed for rapid data acquisition, achieving speeds of 25 µS and offering a robust dynamic range of over 55dB without the need to change range settings. It provides extensive data storage capacity, up to 100,000 data points, and maintains low spectral ripple. As the premium model, the 81637B stands out for its minimal Polarization Dependent Loss (PDL) dependency, setting it apart from its economical counterpart, the 81636B. This makes the 81637B particularly effective for applications such as swept lambda testing and the assessment of PDL-sensitive devices, where quick and precise WDM component characterization over wavelength is essential.ドキュメント
ドキュメントなし
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
81637B
検証済み
カテゴリ
Electronic Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
88264
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
81637B
カテゴリ
Electronic Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
88264
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The 81637B Fast Power Meter is a high-performance instrument designed for rapid data acquisition, achieving speeds of 25 µS and offering a robust dynamic range of over 55dB without the need to change range settings. It provides extensive data storage capacity, up to 100,000 data points, and maintains low spectral ripple. As the premium model, the 81637B stands out for its minimal Polarization Dependent Loss (PDL) dependency, setting it apart from its economical counterpart, the 81636B. This makes the 81637B particularly effective for applications such as swept lambda testing and the assessment of PDL-sensitive devices, where quick and precise WDM component characterization over wavelength is essential.ドキュメント
ドキュメントなし