FOCUS FE III
カテゴリ
Elipsometry概要(Overview)
FOCUS FE III system provides a low cost 100 to 200 millimeters automated ellipsometer using our dual wavelength Focused Beam technology. It directly measures sample wafers with a small spot at multiple angles of incidence.
現在の掲載品
4
サービス
検査、保証、鑑定、ロジスティクス