SE-3000
カテゴリ
Elipsometry概要（Overview）
Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
