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SEMILAB SE-3000
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
    ドキュメント
    ファイルアイコン

    SOPRA frame SE300.pdf

    SEMILAB

    SE-3000

    verified-listing-icon

    検証済み

    カテゴリ
    Elipsometry

    最終検証： 60日以上前

    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    84893

    ウェーハサイズ：

    12"/300mm

    ヴィンテージ：

    2004

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    SEMILAB SE-3000

    SEMILAB

    SE-3000

    Elipsometry
    ヴィンテージ： 2004状態： 中古
    最終確認60日以上前

    SEMILAB

    SE-3000

    verified-listing-icon
    検証済み
    カテゴリ
    Elipsometry
    最終検証： 60日以上前
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/a2cda83d16404a269edfdfe64a73056e_7a1abc1cab804d11b2363a26987355bd_mw.jpeg
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    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/3e4d17a45f184b65b1c00c5189af7403_92064762282546549b002a741bee612d_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/b9267f7969884871a78fe9bc8f1a99f5_abb494cf22a74e4db4b590742119356a_mw.jpeg
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    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/6dcc90a1e77445748a163eeaac47b9d2_77d13ad3a6f94ee786aacf4c433e32d645005c_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/865858dbd27a4d008e30feffac08e0f7_3c5ff27725794b228339e8975a2d824c1201a_mw.jpeg
    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    84893

    ウェーハサイズ：

    12"/300mm

    ヴィンテージ：

    2004

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
    ドキュメント
    ファイルアイコン

    SOPRA frame SE300.pdf

    同様のリスト
    すべて表示
    SEMILAB SE-3000

    SEMILAB

    SE-3000

    Elipsometryヴィンテージ： 2004状態： 中古最終検証： 60日以上前