説明
ANALYTICAL EQUIPMENT構成
•E-beam Resolution3nm @ 1KV •Ion-beam Resolution7nm/22nA, Magnum •Stage5 Axis, Eucentric, Motorized •Stage Travel50 x 50 mm •Z, R25mm, 360 deg •Tilt-10 -+52 •Sample EntryFront Drawer or LL •Gas Chemistry"Two included (material of choice)2 additional can be added as options" •SoftwareFEI xP •OSWin NT •Vacuum: Turbo •EDX - optional •BSE - optional •STEM - optional •Liftout - optionalOEMモデルの説明
The FEI Strata DB 235 is a dual-beam system that combines the capabilities of a focused ion beam (FIB) and a scanning electron microscope (SEM). It features both a Hexalens electron column and a Magnum ion column, making it well-suited for failure analysis and high-end sample preparation. The SEM component uses a Schottkey emitter and operates at 200-300 kV, while the FIB component uses Gallium liquid metal and operates at 5 to 30 kV with a current range of 1pA to 20 nA. The system offers high resolution, with 3 nm for SEM and 7 nm for FIB. It is controlled by the Window NT system and can perform automated TEM sample preparation. An attached EDAX electron dispersive X-ray analysis system allows for chemical analysis. Additionally, the FIB/SEM has the unique ability to add or remove material with high spatial resolution between precisely defined locations.ドキュメント
ドキュメントなし
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
STRATA DB 235
検証済み
カテゴリ
FIB
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
20858
ウェーハサイズ：
不明
ヴィンテージ：
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
STRATA DB 235
検証済み
カテゴリ
FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
20858
ウェーハサイズ：
不明
ヴィンテージ：
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
ANALYTICAL EQUIPMENT構成
•E-beam Resolution3nm @ 1KV •Ion-beam Resolution7nm/22nA, Magnum •Stage5 Axis, Eucentric, Motorized •Stage Travel50 x 50 mm •Z, R25mm, 360 deg •Tilt-10 -+52 •Sample EntryFront Drawer or LL •Gas Chemistry"Two included (material of choice)2 additional can be added as options" •SoftwareFEI xP •OSWin NT •Vacuum: Turbo •EDX - optional •BSE - optional •STEM - optional •Liftout - optionalOEMモデルの説明
The FEI Strata DB 235 is a dual-beam system that combines the capabilities of a focused ion beam (FIB) and a scanning electron microscope (SEM). It features both a Hexalens electron column and a Magnum ion column, making it well-suited for failure analysis and high-end sample preparation. The SEM component uses a Schottkey emitter and operates at 200-300 kV, while the FIB component uses Gallium liquid metal and operates at 5 to 30 kV with a current range of 1pA to 20 nA. The system offers high resolution, with 3 nm for SEM and 7 nm for FIB. It is controlled by the Window NT system and can perform automated TEM sample preparation. An attached EDAX electron dispersive X-ray analysis system allows for chemical analysis. Additionally, the FIB/SEM has the unique ability to add or remove material with high spatial resolution between precisely defined locations.ドキュメント
ドキュメントなし