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ADVANTEST T5377
    説明
    Memory Tester
    構成
    Memory Tester
    OEMモデルの説明
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    ドキュメント

    ドキュメントなし

    ADVANTEST

    T5377

    verified-listing-icon

    検証済み

    カテゴリ
    Final Test

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    90934


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2003

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final Test
    ヴィンテージ: 2003状態: 中古
    最終確認60日以上前

    ADVANTEST

    T5377

    verified-listing-icon
    検証済み
    カテゴリ
    Final Test
    最終検証: 60日以上前
    listing-photo-c7f07f0afb964c6ba6e0c11234d1dc54-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    90934


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2003


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Memory Tester
    構成
    Memory Tester
    OEMモデルの説明
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final Testヴィンテージ: 2003状態: 中古最終検証: 60日以上前
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final Testヴィンテージ: 2009状態: 中古最終検証: 60日以上前
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final Testヴィンテージ: 2003状態: 中古最終検証: 60日以上前