Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

ADVANTEST

T2000 GS

T5376

The T5586 Memory Test System enables high throughput testing of DDR SDRAMs.

T5586

T 53P

T6361

T7315

T5372

T7723 test system is for non memory semiconductors for mixed signal integrated circuits. The T7723 targets highly complex semiconductors used in car electronics and is the result of the development of Advantest's constituent technology that measures analog signal. T7723 uses a direct current signal generator with range of 150V to 64V and floating power supply of 60V/10A or 30V/30A (pulse), utilizes up to maximum of 256 pins, and has the capacity to simultaneously measure multiple devices.

T7723

With a maximum test speed of 8Gbps, the T5511 is the world's fastest memory testers, supporting the very fastest GDDR5-SDRAM devices with capacity to spare. Furthermore, since all the system's test pins support 8Gbps, no reduction in parallelism occurs when operating at high speed.

T5511

T5311

T5336

T6565A

T3334

T2000 ISS

Advantest's M4541AD dynamic test handler for SoC and other high-end logic devices offered parallel test of up to eight devices, testing up to 6,000 devices per hour.

M4541AD

T5365

M4632A

T5361

PIRANHA 3300

T5363

Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest's second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.

T5503HS2

The M6241 can handle up to 512 memory semiconductors simultaneously, including DDR2-SDRAM or DDR3-SDRAM memory semiconductors, and has achieved a maximum throughput of 20,000 semiconductors per hour.

M6241

T5723ES

The M6541A Dynamic Test Handler is designed with a proprietary four-step handling function that keeps index time to a minimum, the M6541A can handle simultaneous testing of up to 64 devices — 6,000 devices per hour. The M6541A's touch panel and comprehensive help function make it extremely easy to operate. In addition, the system was designed so that the time needed for establishing operating requirements and correcting problems are significantly reduced.

M6541A

The ATS 5034 SLT (System-Level Test Platform) delivers a level of sophisticated testing that automates system level testing on a massive scale, making it easy and affordable to conduct 100% SLT. Test up to 396 DUTs simultaneously to achieve a throughput volume of up to 5,000 units per hour (UPH). Combine this throughput with a small factory floor footprint and achieve the industry's lowest cost of system-level test.

ATS 5034

M4742A

T6331

T5381A

T 5503F

T5362

T5571P

T6372L

The ADVANTEST T5503 is the flagship model in the T5500 series, specifically designed for testing and production of ultra high-speed memory semiconductors, including DDR3-SDRAM. This advanced system provides twice the testing speed coverage of the T5501, resulting in enhanced measurement accuracy.

T5503

T5363P

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. 

T7722

The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.

T5221

ADCE 8250A

B6700ES incorporates all capabilities of the B6700. It contributes to a reduced TAT (turn around time) from R&D to device production.

B6700ES

A new multifunctional memory test system that provides high-speed memory test coverage for diverse next-generation memory chips. The T5835 achieves massive parallelism and test speeds more than double those of previous products, meeting the testing needs of next-generation memory devices with increased speed and capacity.

T5835

T3332

T 3325

T5833ES

M6742AD

Using a precision visual-alignment system, the M6245 handler can achieve contact accuracy to within 0.3 mm ball pitch. In addition to improving test yields, this enables faster set-up and calibration for maximum throughput.

M6245

T5581D

M6742A

M4642A

T5587

T8571A	

M 7211

T5723

ND1 6371

ADVANTEST’s T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test.  Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even higher in parallelism, the T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.

T5385

T5332P

T6575A

The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

T5851

Flash memory semiconductors require more types of front-end testing than other types of semiconductors. Advantest's front-end test system for flash memory semiconductors is the T5724. The T5724 is capable of simultaneously testing up to 2,048 flash memory semiconductors with the Built-in-Self-Test, or BIST, function, which is sixteen times greater than the capability of previous models, and significantly lower test costs. The increase in capability is dues to the T5724's use of a probe card that allows for aggregate wafer contact which increases test speed.

T5724

As portable applications are booming, the global market for flash-memory test systems is projected to continuously grow. Cost-effectively testing these non-volatile memories requires a versatile platform to enable a high return on investment (ROI) and reduce users' financial risk. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories. It uses a scalable, built-in high-current programmable power supply (PPS) architecture that provides the flexibility and economic performance to handle low-pin-count to high-pin-count devices. The system also leverages Advantest's innovative Tester-per-Site™ design. This allows each site to operate independently, enabling very fast test times and lowering the overall cost of test.

T5830

B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

B6700S

The top-of-the-line device in the T5500 series is the T5501, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductor such as the next generation SGRAM. This model allows twice as much spectrum band to be covered in terms of testing speed as the T5593 and thus enhances the measurement accuracy.

T5501

Advanced automobiles are required to have improved environmental and safety performance, and are also expected to be connected to the IoT through connected car and autonomous car technology.
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest's proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond. Combined with a test handler and Advantest's EVA100 measurement system, the HA7200 anchors a sensor test cell system that provides an easy-to-use test environment covering all stages of product development, from design evaluation to mass production.

HA7200

The newest automobiles are required to have good environmental performance and fuel-saving functionality.
Powerful, fuel-saving, low-emissions diesel engines have particulate filters and oxidation catalysts for purifying NOx and soot in their exhaust systems. In order to maintain the performance of these systems, exhaust gas pressure is monitored by differential pressure sensors. The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest's unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.

HA7300

Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.

T5773

Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.

MPT3000ES2

High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.

T6391

T3347P

The T5761 covers the full range of testing, from NAND-type flash memory testing to package testing. The T5761 is capable of simultaneous testing up to 512 devices, which is twice the capability of Advantest's previous model, and allow for lower testing costs through its improved ability to detect failures. 

T5761

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. The T7721 targets highly complex semiconductors used in car electronics and results from the development of Advantest's constituent technology that measures analog signals. The T7721 uses a direct current signal generator with a range of 150V to  64V and utilized up to a maximum of 256 pins, and the T7721 has the capacity to simultaneously measure multiple devices.

T7721

B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.

B6700L

The ADVANTEST T5375 is a memory semiconductor test system specifically designed for mass production of high-speed memory semiconductors such as DDR3-SDRAM, LPDDR2, and LPDDR3 in the 1 Gbps to 2 Gbps class. 

T5503A

B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.

B6700

T6671E

MPT3000ES

The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. Aimed at the memory device market, including TSOP, SOJ, QFP, BGA, and CSP set-ups, the device provides an advanced memory production system.

M6751A

H5620ES

T5331

The TAS5500 performs absolute power measurement in the terahertz band to a high standard of accuracy, utilizing a large-diameter calorimeter. Based on the Japanese national standard for infrared measurement of 10.6μm, which Advantest has expanded to the terahertz region, the TAS5500 delivers measurement accuracy of ±11%.

TAS5500

T3326A

As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.

MPT3000HVM2

T5771P

H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.

H5620

M6721A

The M6242 supports memory device package types such as BGA and CSP, and its throughput of 42,200 units per hour is more than double that of the company's previous model, M6241. It offers highly efficient device transfer, thanks to optimization of the complex arm mechanisms that sort good and bad devices after testing. The M6242 enhances productivity and slashes overall cost of test.

M6242

T5781

T5591

The M4541A Dynamic Test Handler is capable of simultaneously testing up to four logic devices, including MCUs, ASICs, and SOCs. This new handler possesses a maximum throughput of 6,000 devices per hour, roughly twice that of its predecessors. The handler's efficient structural layout provides a smaller footprint while helping to reduce testing costs.

M4541A

Automated IC handler features remote operation and thermal control to increase the productivity of semiconductor engineering labs.
Today's mobile electronics market consumes large volumes of ICs that require high power dissipation during device characterization and pre-production bring up. To test these devices, IDMs and OSATs need systems capable of cost-efficient thermal control and automated device handling. Advantest's M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.

M4171

M6771A

T5381

This close cooperation between engineers from Japan and the U.S. is to thank for the success of the Japan and U.S. tester development teams in making it possible for Advantest to ship the T5831ES system designed for next-generation NAND flash memory R&D applications in April 2013, as initially planned.

T5831ES

The T5385ES Memory Test System for DRAM Development Designed for engineering use, the smaller T5385ES offers all the functional and performance qualities of the T5385. Device engineering and characterization can easily be performed, and test programs developed on the T5385ES can be seamlessly transferred to the T5385, accelerating the DRAM development processes.

T5385ES

T5830ES

T5382A

T5378

M6721AD

The T6362 and T6372 are test systems for non memory semiconductors for semiconductors used with high-definition LCD displays. This system can simultaneously test multiple semiconductors for LCD driver integrated circuits with a total of up to 1,536 pins.

T6362

The T5761ES retains the same capabilities and functions as the T5761 with a substantially smaller size an at lower testing costs. The T5761ES is capable of simultaneous testing up to 16 devices, evaluation devices in a simplified manner and easily making testing programs available for mass-production. Through the use of the T5761/T5761ES, effective solutions can be structured, from the design of NAND-type flash memory to mass production.

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

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T5830

T5851

T5724

B6700S

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