概要（Overview）

the T5782 is designed with per-site architecture and industry-leading speeds of 266MHz/533Mbps, and is ideally suited for testing today's flash memories, as well as future device generations including memory-embedded microcontrollers and rapidly evolving memory bus environments. The T5782's at-speed, at-specification performance meets the requirements of tomorrow's Known Good Die (KGD) and MCP memory solutions.