
説明
説明なし構成
TestHead Config module 3 Slot 1 ASRU C Slot 2 HsT_DD2 Slot 3 HsT_DD2 Slot 4 Access Slot 5 HsT_DD2 Slot 6 CtI_xT Slot 7 HsT _DD2 Slot 8 HsT_DD2 Slot 9 HsT_DD2 Slot 10 HsT_DD2 Slot 11 AccessOEMモデルの説明
The Agilent 3070 Series 3 in-circuit board testers are designed to meet the challenges of today's manufacturing environment. With probe-free coverage and diagnostics, these testers offer easy test development for complex boards with limited probe access. Achieve faster testing and eliminate hidden costs with productivity tools. The high-speed flash programming solution brings efficiency to your production line and improves your bottom line. Fulfill high volume requirements and exceed customer expectations while maintaining profitability.ドキュメント
ドキュメントなし
カテゴリ
Final Test
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
101347
ウェーハサイズ:
不明
ヴィンテージ:
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
3070 SERIES 3
カテゴリ
Final Test
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
101347
ウェーハサイズ:
不明
ヴィンテージ:
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
TestHead Config module 3 Slot 1 ASRU C Slot 2 HsT_DD2 Slot 3 HsT_DD2 Slot 4 Access Slot 5 HsT_DD2 Slot 6 CtI_xT Slot 7 HsT _DD2 Slot 8 HsT_DD2 Slot 9 HsT_DD2 Slot 10 HsT_DD2 Slot 11 AccessOEMモデルの説明
The Agilent 3070 Series 3 in-circuit board testers are designed to meet the challenges of today's manufacturing environment. With probe-free coverage and diagnostics, these testers offer easy test development for complex boards with limited probe access. Achieve faster testing and eliminate hidden costs with productivity tools. The high-speed flash programming solution brings efficiency to your production line and improves your bottom line. Fulfill high volume requirements and exceed customer expectations while maintaining profitability.ドキュメント
ドキュメントなし