説明
説明なし構成
構成なしOEMモデルの説明
The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.ドキュメント
ドキュメントなし
カテゴリ
Final Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
128956
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
4072B
カテゴリ
Final Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
128956
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.ドキュメント
ドキュメントなし