説明
Agilent 4073A Parameter Test System 32pin(of 32pins, 4pins fail), MPSMU*1pcs, Pulse/Pattern Generator(81110A), Digit Nano Volt /Micro Ohm Meter(34420A), Digital Multi Meter(3458A), W/S(HDD missing) Pin Card Type: E3122-66501構成
構成なしOEMモデルの説明
The Agilent 4073A ultra advanced parametric tester with Agilent SPECS is designed to perform highly precise DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-resolution SMUs (HRSMUs), and two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.ドキュメント
ドキュメントなし
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
4073A
検証済み
カテゴリ
Final Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
61046
ウェーハサイズ：
不明
ヴィンテージ：
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
4073A
カテゴリ
Final Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
61046
ウェーハサイズ：
不明
ヴィンテージ：
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Agilent 4073A Parameter Test System 32pin(of 32pins, 4pins fail), MPSMU*1pcs, Pulse/Pattern Generator(81110A), Digit Nano Volt /Micro Ohm Meter(34420A), Digital Multi Meter(3458A), W/S(HDD missing) Pin Card Type: E3122-66501構成
構成なしOEMモデルの説明
The Agilent 4073A ultra advanced parametric tester with Agilent SPECS is designed to perform highly precise DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-resolution SMUs (HRSMUs), and two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.ドキュメント
ドキュメントなし