説明
Equipment: Apollo Wave – SJD AP series Probe Station. * B1500A Parameter Analyzer Mainframe x 1 EasyEXPERT x 1 HRSMU x 3 MFCMU x 1 SPGU x 1 Calibration for free before shipment. * Manual Prober 8 inch manual probe station, compact shielding type, 200 x 200 mm XY movement. Theta, up/down chuck, 2 steps vacuum. -40 ~ 200 Thermal Triaxial chuck, including PC software control. Microscope bridge mount: 50 x 50 mm XY movement. Tungsten needle (25 pcs/box) Vibration table Upgrade Micro chamber for stable low leakage 3 sets probe needles. * Wave Laser System Wave Laser System, UV+GRN (355+532nm), 100-240V Objective, NUV100X, 11 mm working distance, U.V. passive Objective, NUV50X, 15 mm working distance, U.V. passive構成
構成なしOEMモデルの説明
The B1500A Semiconductor Device Analyzer is a versatile instrument that integrates multiple measurement and analysis capabilities for accurate and quick device characterization. It provides a wide range of device characterization capabilities, uncompromised measurement reliability, and repeatability. This single-box solution covers all your device characterization needs, from fundamental current-voltage and capacitance-voltage characterization to advanced ultra-fast IV testing. Its modular architecture allows for easy expansion or upgrades, and the included EasyEXPERT software enables efficient and repeatable device characterization. Accelerate your device characterization with the B1500A Semiconductor Device Analyzer.ドキュメント
カテゴリ
Final Test
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142207
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
B1500A
カテゴリ
Final Test
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142207
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available