説明
説明なし構成
Qty TMUX ASM2625 1 LIB ASM1508 1 ASM0817 1 THIB ASM3178 1 PMU ASM1808 1 MCS ASM3236 1 MCM-DDS ASM3161 1 ISOCOM ASM3066 1 SPU-500 ASM1543 1 SPU-100 ASM1544 1OEMモデルの説明
The ETS-200T discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. The ETS-200T provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter.ドキュメント
ドキュメントなし
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
135867
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TERADYNE / EAGLE
ETS-200T
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
135867
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Qty TMUX ASM2625 1 LIB ASM1508 1 ASM0817 1 THIB ASM3178 1 PMU ASM1808 1 MCS ASM3236 1 MCM-DDS ASM3161 1 ISOCOM ASM3066 1 SPU-500 ASM1543 1 SPU-100 ASM1544 1OEMモデルの説明
The ETS-200T discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. The ETS-200T provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter.ドキュメント
ドキュメントなし