説明
説明なし構成
EDS/ TESTOEMモデルの説明
Catalyst is a test system that delivers full test coverage for a wide range of semiconductor applications, including xDSL, wireless/RF, networking, and power management. It was the first SOC test system and is now the world’s leading SOC test system with over 1600 systems installed at customers around the world. The Catalyst family extends its range to more pins and Gigahertz speed with the Teradyne Tiger™ test system. It features fully integrated analog and digital instrumentation, mixed-signal/SOC digital with data rates to 400 Mbps, full spectrum AC instrumentation, Background-DSP™ processing, IMAGE™ programming system with interactive debug displays and complete test engineering tools for device characterization, and a system architecture that accelerates test development and high-volume production for ICs with complex digital, embedded memory, and high-performance analog components.ドキュメント
ドキュメントなし
TERADYNE
CATALYST
検証済み
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
116757
ウェーハサイズ：
8"/200mm, 12"/300mm
ヴィンテージ：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
TERADYNE
CATALYST
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
116757
ウェーハサイズ：
8"/200mm, 12"/300mm
ヴィンテージ：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
EDS/ TESTOEMモデルの説明
Catalyst is a test system that delivers full test coverage for a wide range of semiconductor applications, including xDSL, wireless/RF, networking, and power management. It was the first SOC test system and is now the world’s leading SOC test system with over 1600 systems installed at customers around the world. The Catalyst family extends its range to more pins and Gigahertz speed with the Teradyne Tiger™ test system. It features fully integrated analog and digital instrumentation, mixed-signal/SOC digital with data rates to 400 Mbps, full spectrum AC instrumentation, Background-DSP™ processing, IMAGE™ programming system with interactive debug displays and complete test engineering tools for device characterization, and a system architecture that accelerates test development and high-volume production for ICs with complex digital, embedded memory, and high-performance analog components.ドキュメント
ドキュメントなし