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TERADYNE IP750EMP
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The IP750EMP is a powerful and flexible testing system built with Teradyne’s J750 VLSI test platform, which has over 1,700 systems installed worldwide. It is an upgrade to the IP750 series systems and can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market. The IP750EMP is designed for shorter test time, featuring a multiple-PC architecture that allows image data processing (IDP) for multiple sites to be done individually but simultaneously. This provides a flexible solution for the needs of large IDP device testing. With its advanced capabilities, the IP750EMP is a reliable and efficient choice for your testing needs.
    ドキュメント

    ドキュメントなし

    TERADYNE

    IP750EMP

    verified-listing-icon

    検証済み

    カテゴリ
    Final Test

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    107251


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    TERADYNE IP750EMP

    TERADYNE

    IP750EMP

    Final Test
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    TERADYNE

    IP750EMP

    verified-listing-icon
    検証済み
    カテゴリ
    Final Test
    最終検証: 60日以上前
    listing-photo-79369e00f2394572b3bb61ff31eebc67-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    107251


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The IP750EMP is a powerful and flexible testing system built with Teradyne’s J750 VLSI test platform, which has over 1,700 systems installed worldwide. It is an upgrade to the IP750 series systems and can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market. The IP750EMP is designed for shorter test time, featuring a multiple-PC architecture that allows image data processing (IDP) for multiple sites to be done individually but simultaneously. This provides a flexible solution for the needs of large IDP device testing. With its advanced capabilities, the IP750EMP is a reliable and efficient choice for your testing needs.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    TERADYNE IP750EMP

    TERADYNE

    IP750EMP

    Final Testヴィンテージ: 0状態: 中古最終検証:60日以上前
    TERADYNE IP750EMP

    TERADYNE

    IP750EMP

    Final Testヴィンテージ: 0状態: 中古最終検証:60日以上前
    TERADYNE IP750EMP

    TERADYNE

    IP750EMP

    Final Testヴィンテージ: 0状態: 中古最終検証:60日以上前