説明
Includes full passing diagnostics on final inspection.構成
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEMモデルの説明
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.ドキュメント
ドキュメントなし
TERADYNE
UFLEX-SC
検証済み
カテゴリ
Final Test
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
77340
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示TERADYNE
UFLEX-SC
カテゴリ
Final Test
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
77340
ウェーハサイズ:
不明
ヴィンテージ:
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Includes full passing diagnostics on final inspection.構成
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEMモデルの説明
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.ドキュメント
ドキュメントなし