説明
If GIS is not required, the cost can be reduced by $43,000. If the molecular pump and molecular pump controller are not required, the cost can be reduced by $18,000.構成
This is currently working online, configured as: magnum column, 2GIS: EE, PT, CDEM, stage: 5-axis, Windows NT 4.0OEMモデルの説明
The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.ドキュメント
ドキュメントなし
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 200
検証済み
カテゴリ
Inspection Equipment
最終検証: 30日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
87170
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 200
カテゴリ
Inspection Equipment
最終検証: 30日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
87170
ウェーハサイズ:
不明
ヴィンテージ:
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
If GIS is not required, the cost can be reduced by $43,000. If the molecular pump and molecular pump controller are not required, the cost can be reduced by $18,000.構成
This is currently working online, configured as: magnum column, 2GIS: EE, PT, CDEM, stage: 5-axis, Windows NT 4.0OEMモデルの説明
The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.ドキュメント
ドキュメントなし