メインコンテンツにスキップ
Moov logo

Moov Icon
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 800
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.
    ドキュメント

    ドキュメントなし

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 800

    verified-listing-icon

    検証済み

    カテゴリ
    Inspection Equipment

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    102838


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 800

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 800

    Inspection Equipment
    ヴィンテージ: 1998状態: 中古
    最終確認25日前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 800

    verified-listing-icon
    検証済み
    カテゴリ
    Inspection Equipment
    最終検証: 60日以上前
    listing-photo-87422c10ca8048268222796af0ecfb9c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    102838


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 800

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 800

    Inspection Equipmentヴィンテージ: 1998状態: 中古最終検証: 25日前
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 800

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 800

    Inspection Equipmentヴィンテージ: 0状態: 部品ツール最終検証: 60日以上前
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 800

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 800

    Inspection Equipmentヴィンテージ: 0状態: 中古最終検証: 60日以上前