説明
No missing parts構成
構成なしOEMモデルの説明
The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.ドキュメント
ドキュメントなし
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 1200AT
検証済み
カテゴリ
Inspection Equipment
最終検証： 22日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
114236
ウェーハサイズ：
不明
ヴィンテージ：
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 1200AT
カテゴリ
Inspection Equipment
最終検証： 22日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
114236
ウェーハサイズ：
不明
ヴィンテージ：
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
No missing parts構成
構成なしOEMモデルの説明
The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.ドキュメント
ドキュメントなし