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NAS GIKEN SC-9100
    説明
    [Overview] SC-9100 is a high-precision, Semi-Automated Wafer Surface Contamination Recovery Device. Specially designed for Vapor Phase Decomposition (VPD) and wafer surface liquid phase droplet scanning (WSD /WSL), these tools serve as the perfect pre-treatment / sample preparation solution for ICP-MS and TXRF trace metal analysis. Ideal cost-effective alternative for semiconductor R&D labs and foundry QA/QC pipelines seeking reliable wafer contamination control. [Key Features & Specifications] • Condition: 100% Brand New (Never used, direct from source in original packaging) • Vintage: 2026 • Manufacturer: NAS Giken, Inc. • Wafer Size Compatibility: Suitable for various flat surfaces, with a size of 4 "/4 inch (100mm), 5”/5 inch (125mm), 6”/6 inch (150mm), 8”/8 inch (200mm), 12”/12 inch (300mm). • Recovery Capabilities: Efficiently collects contaminants from hydrophobic/hydrophilic surfaces, and hydrophobic wafer edges (Bevel). • Sampling Excellence: Delivers stable, high-purity performance (supporting ppm, ppb, and ppt levels) utilizing quasi-concentric or pseudo-concentric sampling methods. • Operation & Environment: Extremely easy to operate. This series must be used inside a clean bench and in conjunction with a VPDBOX. [Pricing, Shipping & Installation] • Standard Lead Time: Crating and shipping will be processed within two months upon receipt of order, followed by on-site installation and commissioning. • Price Notice: Final pricing is subject to fluctuations in the JPY/USD (Yen-Dollar) exchange rate.
    構成
    Device Name: SC-9100 (Perfect for R&D and QC Labs) Wafer Semi-Auto Device of Surface Trace Metal Contamination Recovery for VPD-WSD / VPD-WSL/ICP-MS/TXRF Treatment; Operation: by PC; Attaching / Detaching Liquid Holders: Auto; Supply of Sampling Liquid: Auto; Collection of Sampling Liquid: Auto; Basic Sampling Pattern: Ring-shaped, Fan-shaped, Fixed, Radius, Arc; Additional Sampling Pattern (*1): Side (Bevel), Rectangle, Circular Segment; Orientation Flat (*2): Added to sampling pattern of Ring-shaped, Fixed Radius, Side (Bevel); Auto Cleaning of Liquid Holders: No; Sucking-Up Type Collection of Liquid: Yes; Sampling of Hydrophilic Surface: Yes; Size (WxDxH): 600mmx494mmx790mm; Weight: 50Kg; Recommended Environment: Inside Clean Draft; Utilities: AC-100-240V, DIW, N2, CDA. *1-2: Those options will be quoted separately.
    OEMモデルの説明
    A semi-automated recovery system designed to collect nano-level metal contamination on the surfaces and bevels of silicon wafers.
    ドキュメント
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    検証済み

    カテゴリ
    Lab Equipment

    最終検証: 6日前

    主なアイテムの詳細

    状態:

    New


    稼働ステータス:

    Installed / Running


    製品ID:

    148307


    ウェーハサイズ:

    4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm, 12"/300mm


    ヴィンテージ:

    2026


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    NAS GIKEN SC-9100

    NAS GIKEN

    SC-9100

    Lab Equipment
    ヴィンテージ: 2026状態: 新規
    最終確認6日前

    NAS GIKEN

    SC-9100

    verified-listing-icon
    検証済み
    カテゴリ
    Lab Equipment
    最終検証: 6日前
    listing-photo-2aaf3615ebc7403c8901724995cdc854-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/92349/148307/45b56e38f20f476fb243c913d37cbc5f_d88bc4f980ee4cd7987e562db5007d92sc9100_mw.png
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    主なアイテムの詳細

    状態:

    New


    稼働ステータス:

    Installed / Running


    製品ID:

    148307


    ウェーハサイズ:

    4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm, 12"/300mm


    ヴィンテージ:

    2026


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    [Overview] SC-9100 is a high-precision, Semi-Automated Wafer Surface Contamination Recovery Device. Specially designed for Vapor Phase Decomposition (VPD) and wafer surface liquid phase droplet scanning (WSD /WSL), these tools serve as the perfect pre-treatment / sample preparation solution for ICP-MS and TXRF trace metal analysis. Ideal cost-effective alternative for semiconductor R&D labs and foundry QA/QC pipelines seeking reliable wafer contamination control. [Key Features & Specifications] • Condition: 100% Brand New (Never used, direct from source in original packaging) • Vintage: 2026 • Manufacturer: NAS Giken, Inc. • Wafer Size Compatibility: Suitable for various flat surfaces, with a size of 4 "/4 inch (100mm), 5”/5 inch (125mm), 6”/6 inch (150mm), 8”/8 inch (200mm), 12”/12 inch (300mm). • Recovery Capabilities: Efficiently collects contaminants from hydrophobic/hydrophilic surfaces, and hydrophobic wafer edges (Bevel). • Sampling Excellence: Delivers stable, high-purity performance (supporting ppm, ppb, and ppt levels) utilizing quasi-concentric or pseudo-concentric sampling methods. • Operation & Environment: Extremely easy to operate. This series must be used inside a clean bench and in conjunction with a VPDBOX. [Pricing, Shipping & Installation] • Standard Lead Time: Crating and shipping will be processed within two months upon receipt of order, followed by on-site installation and commissioning. • Price Notice: Final pricing is subject to fluctuations in the JPY/USD (Yen-Dollar) exchange rate.
    構成
    Device Name: SC-9100 (Perfect for R&D and QC Labs) Wafer Semi-Auto Device of Surface Trace Metal Contamination Recovery for VPD-WSD / VPD-WSL/ICP-MS/TXRF Treatment; Operation: by PC; Attaching / Detaching Liquid Holders: Auto; Supply of Sampling Liquid: Auto; Collection of Sampling Liquid: Auto; Basic Sampling Pattern: Ring-shaped, Fan-shaped, Fixed, Radius, Arc; Additional Sampling Pattern (*1): Side (Bevel), Rectangle, Circular Segment; Orientation Flat (*2): Added to sampling pattern of Ring-shaped, Fixed Radius, Side (Bevel); Auto Cleaning of Liquid Holders: No; Sucking-Up Type Collection of Liquid: Yes; Sampling of Hydrophilic Surface: Yes; Size (WxDxH): 600mmx494mmx790mm; Weight: 50Kg; Recommended Environment: Inside Clean Draft; Utilities: AC-100-240V, DIW, N2, CDA. *1-2: Those options will be quoted separately.
    OEMモデルの説明
    A semi-automated recovery system designed to collect nano-level metal contamination on the surfaces and bevels of silicon wafers.
    ドキュメント
    同様のリスト
    すべて表示
    NAS GIKEN SC-9100

    NAS GIKEN

    SC-9100

    Lab Equipmentヴィンテージ: 2026状態: 新規最終検証:6日前