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ONTO / RUDOLPH / AUGUST S200
    説明
    説明なし
    構成
    S200 FX - 4 Chamber
    OEMモデルの説明
    The S200 is a metrology system designed by Rudolph to meet the challenges of high-yield semiconductor production at 0.18μm and below. It offers the industry’s highest repeatability laser-ellipsometer and a High Repeatability Mode (HRM™) for next-generation gates. The system has a 5x10μm measurement spot, the smallest in the industry, allowing for accurate measurements in test structures three times smaller than those required by other systems. Its unique simultaneous multiple angle of incidence ellipsometry provides accurate measurements, resulting in powerful multi-layer film characterization and superior process control. The S200 also has a high wafer-per-hour throughput, nearly twice that of competing ellipsometers, and long 20-30,000 hour laser lifetimes provide unparalleled system-to-system matching, superior repeatability, and significantly lower maintenance.
    ドキュメント

    ドキュメントなし

    ONTO / RUDOLPH / AUGUST

    S200

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    66632


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2012


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / RUDOLPH / AUGUST S200

    ONTO / RUDOLPH / AUGUST

    S200

    Metrology
    ヴィンテージ: 2000状態: 中古
    最終確認60日以上前

    ONTO / RUDOLPH / AUGUST

    S200

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 60日以上前
    listing-photo-2932d8a5d49e457ba600000fac7a523a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    66632


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2012


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    S200 FX - 4 Chamber
    OEMモデルの説明
    The S200 is a metrology system designed by Rudolph to meet the challenges of high-yield semiconductor production at 0.18μm and below. It offers the industry’s highest repeatability laser-ellipsometer and a High Repeatability Mode (HRM™) for next-generation gates. The system has a 5x10μm measurement spot, the smallest in the industry, allowing for accurate measurements in test structures three times smaller than those required by other systems. Its unique simultaneous multiple angle of incidence ellipsometry provides accurate measurements, resulting in powerful multi-layer film characterization and superior process control. The S200 also has a high wafer-per-hour throughput, nearly twice that of competing ellipsometers, and long 20-30,000 hour laser lifetimes provide unparalleled system-to-system matching, superior repeatability, and significantly lower maintenance.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / RUDOLPH / AUGUST S200

    ONTO / RUDOLPH / AUGUST

    S200

    Metrologyヴィンテージ: 2000状態: 中古最終検証:60日以上前
    ONTO / RUDOLPH / AUGUST S200

    ONTO / RUDOLPH / AUGUST

    S200

    Metrologyヴィンテージ: 2012状態: 中古最終検証:60日以上前