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ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL
    説明
    Film Thickness Measurement System
    構成
    構成なし
    OEMモデルの説明
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    ドキュメント

    ドキュメントなし

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    104576


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 30日以上前
    listing-photo-88c366d2fa174c5dbb22a6d7999573f8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    104576


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Film Thickness Measurement System
    構成
    構成なし
    OEMモデルの説明
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrologyヴィンテージ: 0状態: 中古最終検証:30日以上前