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説明
説明なし構成
Maximum size: 210×210 mm. Semi-automatic measuring instrument of resistivity / sheet resistance by 4 point probe method Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc) Conductive thin film (Metal, ITO etc) Diffused sample , Silicone thin film(LTPS,etc ) Silicon-related epitaxial materials, Ion-implantation sampleOEMモデルの説明
提供なしドキュメント
ドキュメントなし
NAPSON
RG-200PV
カテゴリ
Metrology
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
114433
ウェーハサイズ：
不明
ヴィンテージ：
不明
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説明
説明なし構成
Maximum size: 210×210 mm. Semi-automatic measuring instrument of resistivity / sheet resistance by 4 point probe method Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc) Conductive thin film (Metal, ITO etc) Diffused sample , Silicone thin film(LTPS,etc ) Silicon-related epitaxial materials, Ion-implantation sampleOEMモデルの説明
提供なしドキュメント
ドキュメントなし