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NOVA NOVASCAN 2040
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The NovaScan 2040 and 3060 have an overall measurement time of 13 seconds per wafer for 13 sites, compatible with all high-throughput polishers, enabling measurement and mapping of all wafers both pre- and post-polish without affecting the polisher’s throughput. Nova is the only Integrated Metrology provider to offer both wet and dry integrations allowing customers to choose the best alternative. The NovaScan 2040/3060 utilizes UV Spectrophotometry to accurately measure and map the most advanced applications in the semiconductor industry down to the 0.09µm technology node.
    ドキュメント

    ドキュメントなし

    NOVA

    NOVASCAN 2040

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証: 昨日

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    110895


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2019


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    NOVA NOVASCAN 2040

    NOVA

    NOVASCAN 2040

    Metrology
    ヴィンテージ: 2013状態: 中古
    最終確認昨日

    NOVA

    NOVASCAN 2040

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 昨日
    listing-photo-55f8bc91a2aa4560ac080ecf269e0d53-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    110895


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2019


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The NovaScan 2040 and 3060 have an overall measurement time of 13 seconds per wafer for 13 sites, compatible with all high-throughput polishers, enabling measurement and mapping of all wafers both pre- and post-polish without affecting the polisher’s throughput. Nova is the only Integrated Metrology provider to offer both wet and dry integrations allowing customers to choose the best alternative. The NovaScan 2040/3060 utilizes UV Spectrophotometry to accurately measure and map the most advanced applications in the semiconductor industry down to the 0.09µm technology node.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    NOVA NOVASCAN 2040

    NOVA

    NOVASCAN 2040

    Metrologyヴィンテージ: 2013状態: 中古最終検証:昨日
    NOVA NOVASCAN 2040

    NOVA

    NOVASCAN 2040

    Metrologyヴィンテージ: 2019状態: 中古最終検証:昨日