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OTSUKA / TEKNOLOGUE FE-3000
    説明
    Film thickness measurement system
    構成
    構成なし
    OEMモデルの説明
    A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.
    ドキュメント

    ドキュメントなし

    OTSUKA / TEKNOLOGUE

    FE-3000

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証： 10日前

    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    153395

    ウェーハサイズ：

    不明

    ヴィンテージ：

    不明

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    OTSUKA / TEKNOLOGUE FE-3000

    OTSUKA / TEKNOLOGUE

    FE-3000

    Metrology
    ヴィンテージ： 0状態： 中古
    最終確認10日前

    OTSUKA / TEKNOLOGUE

    FE-3000

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証： 10日前
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/0c69814006344cd9a0c789e30667be21_1000004579scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/e808658681584ed3b8339f33ca4210ad_1000004582scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/cd6d012f157844fcbd5d2cf697f81a55_1000004581scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/aba72c16a492498da5c2f2ddeb817e3c_1000004583scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/31efc7ebe3694cb9804f25aa59027222_1000004584scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/b17b80fb2e854c7f9c2b6725ee10dcab_1000004586scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/ff6ced9c6dc6424e8868e05199ec41ff_1000004585scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/2f3791c658154be78a74111a36719a56_1000004578scrubbed_mw.jpeg
    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    153395

    ウェーハサイズ：

    不明

    ヴィンテージ：

    不明

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Film thickness measurement system
    構成
    構成なし
    OEMモデルの説明
    A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    OTSUKA / TEKNOLOGUE FE-3000

    OTSUKA / TEKNOLOGUE

    FE-3000

    Metrologyヴィンテージ： 0状態： 中古最終検証：10日前